TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_53_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-018-016-14 | FUSED_ID : 6359364768379248910
  IC_TEMP :  -56.60 | VDDM : 1129.64 | AUX_INT :   -5.26 | CsaBias :   82.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.38681e-04 / 2
  ADC_P0  : -5.26016e-03 ± 1.83957e-02
  ADC_P1  : 8.05401e-03 ± 4.42734e-04
  ADC_P2  : -4.99348e-06 ± 2.10667e-06
  CSA_Chi2/NDF : 1.50157e-04 / 2
  CSA_P0  : 5.82289e-02 ± 8.17325e-03
  CSA_P1  : 9.70925e-03 ± 6.15795e-04
  CSA_P2  : -4.36404e-05 ± 9.37783e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [4, 20, 33, 38, 50, 59, 61, 63, 64, 68, 72, 77, 81, 94, 97, 107, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [4, 5, 27, 35, 39, 50, 51, 71, 75, 87, 91, 108, 114, 116, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2967', '1.800', '0.1519', '1.799', '0.0901', '7.000', '0.7077', 1, 1, 1, 1, 1723740786.939127]
VI_after__Init : ['1.202', '0.2969', '1.800', '0.1519', '1.800', '0.0843', '7.000', '0.7076', 1, 1, 1, 1, 1723740794.9625473]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1366', '1.802', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1723740850.7544017]