TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_14_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-002-010-13 | FUSED_ID : 6359364768380231853
  IC_TEMP :  -73.89 | VDDM : 1114.69 | AUX_INT :  -10.99 | CsaBias :   49.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94886e-03 / 2
  ADC_P0  : -1.09947e-02 ± 2.99744e-02
  ADC_P1  : 8.72752e-03 ± 7.61532e-04
  ADC_P2  : -5.98337e-06 ± 3.87490e-06
  CSA_Chi2/NDF : 2.16597e-04 / 2
  CSA_P0  : 5.84061e-02 ± 9.81631e-03
  CSA_P1  : 1.05904e-02 ± 7.39588e-04
  CSA_P2  : -6.63195e-05 ± 1.12631e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [1, 4, 6, 10, 22, 24, 25, 29, 30, 48, 59, 65, 80, 87, 111, 114, 118, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 6, 8, 9, 12, 19, 31, 45, 55, 62, 88, 92, 102, 105, 109, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2360', '1.800', '0.1051', '1.800', '0.0933', '7.000', '0.7069', 1, 1, 1, 1, 1723788858.1533546]
VI_after__Init : ['1.201', '0.2360', '1.800', '0.1051', '1.800', '0.0874', '7.000', '0.7069', 1, 1, 1, 1, 1723788866.1919584]
VI_at__the_End : ['1.201', '0.4593', '1.800', '0.1348', '1.803', '0.1192', '7.000', '0.7077', 1, 1, 1, 1, 1723788916.4718938]