TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_17_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-002-012-13 | FUSED_ID : 6359364768380231885
  IC_TEMP : -105.94 | VDDM : 1126.46 | AUX_INT :  -15.35 | CsaBias :   43.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.37282e-03 / 2
  ADC_P0  : -1.53540e-02 ± 3.93979e-02
  ADC_P1  : 9.81487e-03 ± 1.07305e-03
  ADC_P2  : -8.82406e-06 ± 5.90810e-06
  CSA_Chi2/NDF : 9.64001e-05 / 2
  CSA_P0  : 5.86422e-02 ± 6.54879e-03
  CSA_P1  : 1.06834e-02 ± 4.93404e-04
  CSA_P2  : -8.13151e-05 ± 7.51396e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [3, 7, 15, 20, 21, 23, 33, 76, 87, 95, 102, 113, 114, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [6, 7, 20, 21, 23, 26, 36, 37, 43, 63, 64, 86, 87, 95, 113, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1713', '1.800', '0.1436', '1.799', '0.0985', '7.000', '0.7070', 1, 1, 1, 1, 1723789070.4011421]
VI_after__Init : ['1.202', '0.1712', '1.800', '0.1438', '1.799', '0.0928', '7.000', '0.7071', 1, 1, 1, 1, 1723789078.3955288]
VI_at__the_End : ['1.202', '0.4071', '1.800', '0.1307', '1.657', '0.1200', '7.000', '0.7077', 1, 1, 1, 1, 1723789134.389323]