TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_30_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-002-019-10 | FUSED_ID : 6359364768380231994
  IC_TEMP :  -86.54 | VDDM : 1125.83 | AUX_INT : -169.03 | CsaBias :  -78.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.51559e-03 / 2
  ADC_P0  : -1.69032e-01 ± 4.52771e-02
  ADC_P1  : 1.14116e-02 ± 1.09657e-03
  ADC_P2  : -1.58026e-05 ± 5.26770e-06
  CSA_Chi2/NDF : 1.55949e-04 / 2
  CSA_P0  : 5.67067e-02 ± 8.32940e-03
  CSA_P1  : 1.06012e-02 ± 6.27560e-04
  CSA_P2  : -7.06104e-05 ± 9.55700e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [7, 27, 38, 42, 47, 51, 52, 54, 78, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [14, 23, 26, 35, 37, 40, 45, 69, 77, 89, 98, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3427', '1.800', '0.1111', '1.799', '0.0976', '7.000', '0.7073', 1, 1, 1, 1, 1723789815.402068]
VI_after__Init : ['1.201', '0.3441', '1.800', '0.1116', '1.800', '0.0920', '7.000', '0.7070', 1, 1, 1, 1, 1723789822.8524666]
VI_at__the_End : ['1.201', '0.4381', '1.800', '0.1302', '1.712', '0.1200', '7.000', '0.7079', 1, 1, 1, 1, 1723789882.1148884]