TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_58_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-003-007-00 | FUSED_ID : 6359364768380235888
  IC_TEMP : -100.16 | VDDM : 1125.75 | AUX_INT :  -11.59 | CsaBias :   45.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.03738e-03 / 2
  ADC_P0  : -1.15852e-02 ± 3.05880e-02
  ADC_P1  : 9.52696e-03 ± 8.28130e-04
  ADC_P2  : -8.16468e-06 ± 4.47752e-06
  CSA_Chi2/NDF : 1.32731e-04 / 2
  CSA_P0  : 5.89685e-02 ± 7.68438e-03
  CSA_P1  : 1.05653e-02 ± 5.78963e-04
  CSA_P2  : -7.38806e-05 ± 8.81691e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [16, 20, 27, 36, 50, 53, 61, 80, 83, 86, 93, 94, 106, 120, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [14, 17, 23, 25, 40, 48, 51, 57, 62, 70, 73, 79, 102, 103, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2422', '1.800', '0.1226', '1.799', '0.0957', '7.000', '0.7071', 1, 1, 1, 1, 1723791514.209441]
VI_after__Init : ['1.202', '0.2426', '1.800', '0.1231', '1.799', '0.0899', '7.000', '0.7069', 1, 1, 1, 1, 1723791522.31183]
VI_at__the_End : ['1.201', '0.4277', '1.800', '0.1332', '1.676', '0.1201', '7.000', '0.7076', 1, 1, 1, 1, 1723791576.9627123]