TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_51_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-003-011-00 | FUSED_ID : 6359364768380235952
  IC_TEMP :  -81.82 | VDDM : 1108.15 | AUX_INT :   -9.38 | CsaBias :   45.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22089e-03 / 2
  ADC_P0  : -9.37847e-03 ± 2.35842e-02
  ADC_P1  : 9.12669e-03 ± 6.11732e-04
  ADC_P2  : -7.81964e-06 ± 3.15212e-06
  CSA_Chi2/NDF : 1.84059e-04 / 2
  CSA_P0  : 5.77676e-02 ± 9.04901e-03
  CSA_P1  : 1.03888e-02 ± 6.81778e-04
  CSA_P2  : -6.77684e-05 ± 1.03827e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [6, 15, 20, 23, 39, 46, 50, 56, 72, 74, 87, 102, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [12, 16, 37, 44, 48, 49, 69, 73, 96, 103, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1867', '1.800', '0.1474', '1.799', '0.0954', '7.000', '0.7069', 1, 1, 1, 1, 1723791089.1508105]
VI_after__Init : ['1.201', '0.1870', '1.799', '0.1476', '1.801', '0.0894', '7.000', '0.7068', 1, 1, 1, 1, 1723791097.1831837]
VI_at__the_End : ['1.202', '0.4388', '1.800', '0.1352', '1.720', '0.1200', '7.000', '0.7076', 1, 1, 1, 1, 1723791154.2598953]