TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_42_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-003-016-07 | FUSED_ID : 6359364768380236039
  IC_TEMP :  -83.38 | VDDM : 1134.74 | AUX_INT :   -8.68 | CsaBias :   54.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38562e-03 / 2
  ADC_P0  : -8.68413e-03 ± 2.52485e-02
  ADC_P1  : 9.08825e-03 ± 6.75354e-04
  ADC_P2  : -6.57804e-06 ± 3.58667e-06
  CSA_Chi2/NDF : 1.77806e-04 / 2
  CSA_P0  : 5.97941e-02 ± 8.89397e-03
  CSA_P1  : 1.04803e-02 ± 6.70096e-04
  CSA_P2  : -6.83753e-05 ± 1.02048e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 8, 29, 31, 37, 44, 48, 57, 62, 82, 85, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [0, 4, 10, 11, 15, 27, 30, 31, 32, 37, 43, 51, 55, 59, 79, 80, 104, 105, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2432', '1.800', '0.1265', '1.800', '0.0949', '7.000', '0.7071', 1, 1, 1, 1, 1723790558.226774]
VI_after__Init : ['1.202', '0.2435', '1.800', '0.1265', '1.799', '0.0885', '7.000', '0.7070', 1, 1, 1, 1, 1723790566.2531562]
VI_at__the_End : ['1.201', '0.4455', '1.800', '0.1330', '1.727', '0.1201', '7.000', '0.7078', 1, 1, 1, 1, 1723790621.793936]