TEST_NAME : Wafer
TEST_DATE : 24_08_16-08_39_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-003-018-07 | FUSED_ID : 6359364768380236071
  IC_TEMP :  -75.28 | VDDM : 1103.48 | AUX_INT :   -9.96 | CsaBias :   52.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54109e-03 / 2
  ADC_P0  : -9.95830e-03 ± 2.65743e-02
  ADC_P1  : 9.02076e-03 ± 6.87267e-04
  ADC_P2  : -7.26899e-06 ± 3.53583e-06
  CSA_Chi2/NDF : 1.62414e-04 / 2
  CSA_P0  : 5.80697e-02 ± 8.50029e-03
  CSA_P1  : 1.02471e-02 ± 6.40435e-04
  CSA_P2  : -6.36355e-05 ± 9.75307e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  21
 | N_BROKEN_FAST :  [8, 10, 21, 24, 28, 36, 43, 53, 55, 58, 59, 78, 79, 83, 86, 94, 100, 105, 109, 117, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [12, 24, 26, 43, 50, 64, 78, 80, 89, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2907', '1.800', '0.1630', '1.799', '0.1003', '7.000', '0.7073', 1, 1, 1, 1, 1723790346.5220942]
VI_after__Init : ['1.202', '0.2912', '1.800', '0.1640', '1.800', '0.0944', '7.000', '0.7070', 1, 1, 1, 1, 1723790354.5115182]
VI_at__the_End : ['1.202', '0.4466', '1.800', '0.1334', '1.733', '0.1200', '7.000', '0.7076', 1, 1, 1, 1, 1723790409.95723]