TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_02_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-007-08 | FUSED_ID : 6359364768380239992
  IC_TEMP :  -88.51 | VDDM : 1119.93 | AUX_INT :  -10.57 | CsaBias :   52.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.02737e-03 / 2
  ADC_P0  : -1.05658e-02 ± 3.05775e-02
  ADC_P1  : 9.09707e-03 ± 8.05900e-04
  ADC_P2  : -6.93541e-06 ± 4.22974e-06
  CSA_Chi2/NDF : 1.53642e-04 / 2
  CSA_P0  : 5.85317e-02 ± 8.26755e-03
  CSA_P1  : 1.05857e-02 ± 6.22900e-04
  CSA_P2  : -7.16772e-05 ± 9.48603e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [7, 17, 19, 37, 44, 52, 54, 57, 62, 74, 76, 84, 104, 117, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [1, 43, 52, 89, 96, 102, 103, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2873', '1.800', '0.1192', '1.799', '0.0985', '7.000', '0.7078', 1, 1, 1, 1, 1723791727.232226]
VI_after__Init : ['1.202', '0.2880', '1.799', '0.1200', '1.800', '0.0906', '7.000', '0.7070', 1, 1, 1, 1, 1723791735.1755798]
VI_at__the_End : ['1.201', '0.4370', '1.804', '0.1339', '1.708', '0.1199', '7.000', '0.7079', 1, 1, 1, 1, 1723791789.9373682]