TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_07_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-010-08 | FUSED_ID : 6359364768380240040
  IC_TEMP :  -82.31 | VDDM : 1121.87 | AUX_INT :  -11.24 | CsaBias :   50.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88603e-03 / 2
  ADC_P0  : -1.12444e-02 ± 2.94207e-02
  ADC_P1  : 8.93304e-03 ± 7.49818e-04
  ADC_P2  : -7.05714e-06 ± 3.81720e-06
  CSA_Chi2/NDF : 1.73520e-04 / 2
  CSA_P0  : 5.78716e-02 ± 8.78612e-03
  CSA_P1  : 1.04086e-02 ± 6.61971e-04
  CSA_P2  : -6.68903e-05 ± 1.00810e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [10, 19, 21, 28, 59, 73, 75, 76, 80, 94, 106, 111, 116, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 9, 17, 18, 26, 27, 56, 59, 66, 68, 77, 89, 100, 105, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1855', '1.800', '0.1482', '1.800', '0.0930', '7.000', '0.7070', 1, 1, 1, 1, 1723792047.2217236]
VI_after__Init : ['1.202', '0.1856', '1.800', '0.1481', '1.800', '0.0867', '7.000', '0.7072', 1, 1, 1, 1, 1723792055.1840906]
VI_at__the_End : ['1.202', '0.4452', '1.800', '0.1324', '1.742', '0.1199', '7.000', '0.7079', 1, 1, 1, 1, 1723792109.9418354]