TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_10_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-012-08 | FUSED_ID : 6359364768380240072
  IC_TEMP :  -81.85 | VDDM : 1117.81 | AUX_INT :   -9.78 | CsaBias :   59.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63797e-03 / 2
  ADC_P0  : -9.77848e-03 ± 2.73571e-02
  ADC_P1  : 8.73446e-03 ± 6.74293e-04
  ADC_P2  : -7.23673e-06 ± 3.31091e-06
  CSA_Chi2/NDF : 1.55318e-04 / 2
  CSA_P0  : 5.50198e-02 ± 8.31252e-03
  CSA_P1  : 9.68170e-03 ± 6.26288e-04
  CSA_P2  : -5.88759e-05 ± 9.53763e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 22, 23, 31, 33, 34, 43, 63, 83, 92, 96, 100, 105, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [4, 17, 42, 54, 60, 74, 75, 76, 78, 87, 101, 104, 108, 121, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2151', '1.800', '0.1277', '1.800', '0.1005', '7.000', '0.7072', 1, 1, 1, 1, 1723792259.2263765]
VI_after__Init : ['1.202', '0.2153', '1.800', '0.1279', '1.800', '0.0943', '7.000', '0.7072', 1, 1, 1, 1, 1723792267.234759]
VI_at__the_End : ['1.202', '0.4271', '1.800', '0.1283', '1.744', '0.1199', '7.000', '0.7079', 1, 1, 1, 1, 1723792321.7806523]