TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_12_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-013-08 | FUSED_ID : 6359364768380240088
  IC_TEMP :  -77.24 | VDDM : 1126.25 | AUX_INT :  -84.02 | CsaBias :  -13.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.70871e-03 / 2
  ADC_P0  : -8.40183e-02 ± 4.04882e-02
  ADC_P1  : 1.02043e-02 ± 1.01662e-03
  ADC_P2  : -1.14952e-05 ± 5.06124e-06
  CSA_Chi2/NDF : 1.69186e-04 / 2
  CSA_P0  : 5.96673e-02 ± 8.67571e-03
  CSA_P1  : 1.05381e-02 ± 6.53652e-04
  CSA_P2  : -6.76287e-05 ± 9.95434e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 8, 24, 30, 35, 38, 40, 62, 64, 71, 81, 87, 96, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 40, 44, 80, 89, 97, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3306', '1.800', '0.1257', '1.800', '0.0996', '7.000', '0.7080', 1, 1, 1, 1, 1723792366.207248]
VI_after__Init : ['1.202', '0.3312', '1.800', '0.1258', '1.800', '0.0918', '7.000', '0.7071', 1, 1, 1, 1, 1723792374.2036676]
VI_at__the_End : ['1.202', '0.4503', '1.800', '0.1342', '1.760', '0.1200', '7.000', '0.7081', 1, 1, 1, 1, 1723792429.552364]