TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_14_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-014-08 | FUSED_ID : 6359364768380240104
  IC_TEMP :  -68.09 | VDDM : 1119.36 | AUX_INT :   -8.52 | CsaBias :   59.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31009e-03 / 2
  ADC_P0  : -8.51999e-03 ± 2.44663e-02
  ADC_P1  : 8.59643e-03 ± 6.04270e-04
  ADC_P2  : -6.59211e-06 ± 2.96760e-06
  CSA_Chi2/NDF : 1.77726e-04 / 2
  CSA_P0  : 5.61007e-02 ± 8.89197e-03
  CSA_P1  : 1.03182e-02 ± 6.69946e-04
  CSA_P2  : -6.15638e-05 ± 1.02025e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [6, 16, 27, 33, 37, 40, 45, 50, 56, 68, 79, 81, 85, 91, 99, 100, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [1, 13, 17, 23, 29, 37, 38, 44, 48, 57, 73, 98, 112, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1426', '1.800', '0.1631', '1.799', '0.0889', '7.000', '0.7072', 1, 1, 1, 1, 1723792472.1981187]
VI_after__Init : ['1.202', '0.1426', '1.800', '0.1631', '1.802', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1723792479.473504]
VI_at__the_End : ['1.201', '0.4546', '1.800', '0.1352', '1.800', '0.1197', '7.000', '0.7079', 1, 1, 1, 1, 1723792534.8812551]