TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_16_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-015-08 | FUSED_ID : 6359364768380240120
  IC_TEMP :  -71.26 | VDDM : 1118.38 | AUX_INT :   -9.77 | CsaBias :   66.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41454e-03 / 2
  ADC_P0  : -9.76937e-03 ± 2.54616e-02
  ADC_P1  : 8.48493e-03 ± 6.23504e-04
  ADC_P2  : -6.13051e-06 ± 3.04586e-06
  CSA_Chi2/NDF : 1.88529e-04 / 2
  CSA_P0  : 5.72329e-02 ± 9.15823e-03
  CSA_P1  : 9.95789e-03 ± 6.90007e-04
  CSA_P2  : -5.76551e-05 ± 1.05080e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [10, 12, 49, 51, 57, 76, 87, 92, 94, 96, 100, 105, 115, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [3, 14, 21, 26, 31, 32, 39, 42, 70, 86, 99, 100, 109, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3145', '1.800', '0.1471', '1.799', '0.1003', '7.000', '0.7072', 1, 1, 1, 1, 1723792578.5649347]
VI_after__Init : ['1.202', '0.3152', '1.800', '0.1475', '1.800', '0.0943', '7.000', '0.7073', 1, 1, 1, 1, 1723792586.5883043]
VI_at__the_End : ['1.202', '0.4512', '1.800', '0.1324', '1.764', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1723792641.4790993]