TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_23_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-019-15 | FUSED_ID : 6359364768380240191
  IC_TEMP :  -71.02 | VDDM : 1121.49 | AUX_INT :   -7.83 | CsaBias :   61.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32437e-03 / 2
  ADC_P0  : -7.83282e-03 ± 2.46651e-02
  ADC_P1  : 8.74211e-03 ± 6.31397e-04
  ADC_P2  : -6.24707e-06 ± 3.21183e-06
  CSA_Chi2/NDF : 1.79999e-04 / 2
  CSA_P0  : 5.85841e-02 ± 8.94864e-03
  CSA_P1  : 9.96815e-03 ± 6.74216e-04
  CSA_P2  : -5.67267e-05 ± 1.02675e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 9, 25, 33, 56, 78, 87, 93, 96, 103, 104, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 5, 10, 18, 42, 48, 55, 60, 74, 104, 109, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1052', '1.800', '0.1614', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1723793003.2234087]
VI_after__Init : ['1.202', '0.1053', '1.800', '0.1616', '1.800', '0.0769', '7.000', '0.7071', 1, 1, 1, 1, 1723793011.3718507]
VI_at__the_End : ['1.199', '0.4561', '1.800', '0.1337', '1.768', '0.1199', '7.000', '0.7083', 1, 1, 1, 1, 1723793067.1028433]