TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_28_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-022-15 | FUSED_ID : 6359364768380240239
  IC_TEMP :  -59.14 | VDDM : 1120.91 | AUX_INT :   -9.40 | CsaBias :   74.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47215e-03 / 2
  ADC_P0  : -9.40080e-03 ± 2.60337e-02
  ADC_P1  : 8.46375e-03 ± 6.46784e-04
  ADC_P2  : -5.58467e-06 ± 3.20488e-06
  CSA_Chi2/NDF : 1.74021e-04 / 2
  CSA_P0  : 5.70337e-02 ± 8.79880e-03
  CSA_P1  : 1.02930e-02 ± 6.62926e-04
  CSA_P2  : -5.55485e-05 ± 1.00956e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 13, 60, 66, 76, 92, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [8, 37, 46, 60, 70, 72, 82, 89, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3105', '1.800', '0.1777', '1.800', '0.0943', '7.000', '0.7073', 1, 1, 1, 1, 1723793323.025052]
VI_after__Init : ['1.202', '0.3105', '1.800', '0.1778', '1.800', '0.0889', '7.000', '0.7075', 1, 1, 1, 1, 1723793330.972541]
VI_at__the_End : ['1.202', '0.4804', '1.800', '0.1328', '1.803', '0.1177', '7.000', '0.7083', 1, 1, 1, 1, 1723793388.2662847]