TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_30_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-004-023-15 | FUSED_ID : 6359364768380240255
  IC_TEMP :  -56.61 | VDDM : 1124.06 | AUX_INT :   -8.46 | CsaBias :   68.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13122e-03 / 2
  ADC_P0  : -8.45689e-03 ± 2.27450e-02
  ADC_P1  : 8.58120e-03 ± 5.63052e-04
  ADC_P2  : -6.58012e-06 ± 2.76285e-06
  CSA_Chi2/NDF : 1.64111e-04 / 2
  CSA_P0  : 5.60165e-02 ± 8.54458e-03
  CSA_P1  : 9.80951e-03 ± 6.43772e-04
  CSA_P2  : -4.80995e-05 ± 9.80389e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [14, 50, 62, 68, 74, 77, 80, 83, 92, 100, 110, 112, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [7, 32, 43, 71, 72, 77, 88, 95, 106, 113, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1905', '1.800', '0.1555', '1.800', '0.0941', '7.000', '0.7074', 1, 1, 1, 1, 1723793429.5362008]
VI_after__Init : ['1.202', '0.1904', '1.800', '0.1555', '1.800', '0.0883', '7.000', '0.7073', 1, 1, 1, 1, 1723793437.7645998]
VI_at__the_End : ['1.202', '0.4790', '1.800', '0.1343', '1.802', '0.1169', '7.000', '0.7083', 1, 1, 1, 1, 1723793493.8114557]