TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_58_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-010-05 | FUSED_ID : 6359364768380244133
  IC_TEMP :  -76.96 | VDDM : 1114.60 | AUX_INT :  -10.82 | CsaBias :   67.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.27700e-03 / 2
  ADC_P0  : -1.08178e-02 ± 3.24245e-02
  ADC_P1  : 8.80693e-03 ± 8.26744e-04
  ADC_P2  : -6.20721e-06 ± 4.22722e-06
  CSA_Chi2/NDF : 1.55898e-04 / 2
  CSA_P0  : 6.22052e-02 ± 8.32803e-03
  CSA_P1  : 1.05193e-02 ± 6.27457e-04
  CSA_P2  : -6.91252e-05 ± 9.55543e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [16, 22, 32, 37, 51, 104, 105, 106, 112, 119, 120, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [0, 9, 10, 11, 13, 22, 40, 49, 65, 109, 117, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3117', '1.800', '0.1675', '1.800', '0.1024', '7.000', '0.7075', 1, 1, 1, 1, 1723795130.2020242]
VI_after__Init : ['1.202', '0.3121', '1.800', '0.1683', '1.800', '0.0967', '7.000', '0.7073', 1, 1, 1, 1, 1723795138.2073953]
VI_at__the_End : ['1.202', '0.4467', '1.800', '0.1345', '1.766', '0.1200', '7.000', '0.7079', 1, 1, 1, 1, 1723795195.5087485]