TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_57_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-011-05 | FUSED_ID : 6359364768380244149
  IC_TEMP :  -72.65 | VDDM : 1124.90 | AUX_INT :   -6.12 | CsaBias :   54.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.13169e-04 / 2
  ADC_P0  : -6.11622e-03 ± 1.92442e-02
  ADC_P1  : 8.77053e-03 ± 4.89104e-04
  ADC_P2  : -7.01266e-06 ± 2.45160e-06
  CSA_Chi2/NDF : 1.73320e-04 / 2
  CSA_P0  : 5.87694e-02 ± 8.78105e-03
  CSA_P1  : 1.05294e-02 ± 6.61589e-04
  CSA_P2  : -6.38451e-05 ± 1.00752e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [28, 30, 37, 40, 46, 64, 78, 83, 92, 96, 98, 106, 113, 116, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [14, 19, 30, 32, 34, 38, 45, 47, 50, 116, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2923', '1.800', '0.1734', '1.799', '0.1007', '7.000', '0.7075', 1, 1, 1, 1, 1723795024.224646]
VI_after__Init : ['1.202', '0.2926', '1.800', '0.1738', '1.801', '0.0947', '7.000', '0.7076', 1, 1, 1, 1, 1723795032.300983]
VI_at__the_End : ['1.202', '0.4648', '1.800', '0.1362', '1.786', '0.1198', '7.000', '0.7083', 1, 1, 1, 1, 1723795087.9234853]