TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_53_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-013-05 | FUSED_ID : 6359364768380244181
  IC_TEMP :  -71.50 | VDDM : 1120.31 | AUX_INT :   -9.34 | CsaBias :   66.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24708e-03 / 2
  ADC_P0  : -9.33985e-03 ± 2.38634e-02
  ADC_P1  : 8.46502e-03 ± 5.77384e-04
  ADC_P2  : -6.51596e-06 ± 2.77889e-06
  CSA_Chi2/NDF : 1.62864e-04 / 2
  CSA_P0  : 5.72417e-02 ± 8.51207e-03
  CSA_P1  : 1.00925e-02 ± 6.41323e-04
  CSA_P2  : -5.80856e-05 ± 9.76660e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [4, 26, 38, 65, 67, 69, 77, 79, 86, 96, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [9, 21, 22, 31, 32, 43, 51, 61, 62, 65, 71, 83, 105, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2371', '1.800', '0.1445', '1.799', '0.0936', '7.000', '0.7085', 1, 1, 1, 1, 1723794812.4672832]
VI_after__Init : ['1.202', '0.2373', '1.800', '0.1445', '1.799', '0.0859', '7.000', '0.7075', 1, 1, 1, 1, 1723794820.5646365]
VI_at__the_End : ['1.201', '0.4562', '1.800', '0.1332', '1.785', '0.1199', '7.000', '0.7080', 1, 1, 1, 1, 1723794877.5828242]