TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_46_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-017-02 | FUSED_ID : 6359364768380244242
  IC_TEMP :  -69.43 | VDDM : 1121.24 | AUX_INT :   -9.84 | CsaBias :   67.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63486e-03 / 2
  ADC_P0  : -9.83610e-03 ± 2.74154e-02
  ADC_P1  : 8.67231e-03 ± 6.89458e-04
  ADC_P2  : -6.33706e-06 ± 3.45109e-06
  CSA_Chi2/NDF : 1.72158e-04 / 2
  CSA_P0  : 5.87966e-02 ± 8.75157e-03
  CSA_P1  : 1.07525e-02 ± 6.59368e-04
  CSA_P2  : -6.65331e-05 ± 1.00414e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [0, 8, 13, 16, 32, 56, 78, 79, 85, 86, 93, 95, 102, 103, 105, 107, 109, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [6, 17, 33, 49, 72, 73, 76, 90, 102, 106, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3335', '1.800', '0.1304', '1.800', '0.1030', '7.000', '0.7081', 1, 1, 1, 1, 1723794386.331587]
VI_after__Init : ['1.202', '0.3342', '1.800', '0.1304', '1.800', '0.0945', '7.000', '0.7071', 1, 1, 1, 1, 1723794394.3449469]
VI_at__the_End : ['1.202', '0.4676', '1.800', '0.1355', '1.799', '0.1203', '7.000', '0.7081', 1, 1, 1, 1, 1723794450.789684]