TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_42_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-019-02 | FUSED_ID : 6359364768380244274
  IC_TEMP :  -63.71 | VDDM : 1123.91 | AUX_INT :   -7.54 | CsaBias :   60.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15022e-03 / 2
  ADC_P0  : -7.54224e-03 ± 2.29353e-02
  ADC_P1  : 8.56465e-03 ± 5.67761e-04
  ADC_P2  : -6.51678e-06 ± 2.78595e-06
  CSA_Chi2/NDF : 1.35836e-04 / 2
  CSA_P0  : 5.81896e-02 ± 7.77373e-03
  CSA_P1  : 9.85370e-03 ± 5.85695e-04
  CSA_P2  : -5.06536e-05 ± 8.91944e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [10, 24, 35, 42, 52, 68, 91, 113, 115, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  21
 | P_BROKEN_FAST :  [1, 2, 14, 25, 31, 35, 37, 49, 51, 55, 63, 65, 66, 70, 71, 78, 85, 90, 117, 120, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2718', '1.800', '0.1542', '1.800', '0.0948', '7.000', '0.7073', 1, 1, 1, 1, 1723794173.861531]
VI_after__Init : ['1.202', '0.2720', '1.800', '0.1542', '1.800', '0.0893', '7.000', '0.7072', 1, 1, 1, 1, 1723794181.8069482]
VI_at__the_End : ['1.202', '0.4735', '1.800', '0.1362', '1.800', '0.1180', '7.000', '0.7079', 1, 1, 1, 1, 1723794238.0657313]