TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_39_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-021-02 | FUSED_ID : 6359364768380244306
  IC_TEMP :  -62.34 | VDDM : 1118.91 | AUX_INT :   -7.94 | CsaBias :   59.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32422e-03 / 2
  ADC_P0  : -7.94280e-03 ± 2.46385e-02
  ADC_P1  : 8.44431e-03 ± 6.02781e-04
  ADC_P2  : -6.21287e-06 ± 2.92575e-06
  CSA_Chi2/NDF : 1.74768e-04 / 2
  CSA_P0  : 5.58811e-02 ± 8.81766e-03
  CSA_P1  : 1.00038e-02 ± 6.64347e-04
  CSA_P2  : -5.40070e-05 ± 1.01172e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [11, 14, 41, 48, 74, 78, 90, 97, 100, 105, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [14, 47, 51, 63, 74, 78, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4335', '1.800', '0.1646', '1.800', '0.0968', '7.000', '0.7074', 1, 1, 1, 1, 1723793961.9974587]
VI_after__Init : ['1.202', '0.4345', '1.800', '0.1657', '1.800', '0.0916', '7.000', '0.7073', 1, 1, 1, 1, 1723793969.9998467]
VI_at__the_End : ['1.202', '0.4679', '1.800', '0.1348', '1.800', '0.1181', '7.000', '0.7081', 1, 1, 1, 1, 1723794026.807596]