TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_37_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-022-02 | FUSED_ID : 6359364768380244322
  IC_TEMP :  -70.12 | VDDM : 1130.91 | AUX_INT :   -7.75 | CsaBias :   62.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09348e-03 / 2
  ADC_P0  : -7.75497e-03 ± 2.23310e-02
  ADC_P1  : 8.89061e-03 ± 5.70102e-04
  ADC_P2  : -7.15665e-06 ± 2.89036e-06
  CSA_Chi2/NDF : 1.96723e-04 / 2
  CSA_P0  : 5.94265e-02 ± 9.35512e-03
  CSA_P1  : 1.07623e-02 ± 7.04841e-04
  CSA_P2  : -6.55148e-05 ± 1.07339e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [21, 24, 28, 29, 48, 70, 75, 101, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 3, 21, 24, 28, 45, 60, 64, 84, 85, 89, 91, 100, 115, 119, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4128', '1.800', '0.1784', '1.800', '0.1016', '7.000', '0.7072', 1, 1, 1, 1, 1723793855.5234334]
VI_after__Init : ['1.202', '0.4137', '1.800', '0.1793', '1.800', '0.0955', '7.000', '0.7073', 1, 1, 1, 1, 1723793863.532904]
VI_at__the_End : ['1.202', '0.4721', '1.800', '0.1366', '1.803', '0.1208', '7.000', '0.7081', 1, 1, 1, 1, 1723793919.6246822]