TEST_NAME : Wafer
TEST_DATE : 24_08_16-09_35_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-005-023-02 | FUSED_ID : 6359364768380244338
  IC_TEMP :  -56.32 | VDDM : 1128.38 | AUX_INT :   -7.77 | CsaBias :   65.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22673e-03 / 2
  ADC_P0  : -7.77023e-03 ± 2.37385e-02
  ADC_P1  : 8.22306e-03 ± 5.75763e-04
  ADC_P2  : -5.21052e-06 ± 2.78266e-06
  CSA_Chi2/NDF : 1.52590e-04 / 2
  CSA_P0  : 5.62488e-02 ± 8.23921e-03
  CSA_P1  : 1.01319e-02 ± 6.20765e-04
  CSA_P2  : -5.26310e-05 ± 9.45352e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [6, 27, 30, 32, 35, 36, 48, 53, 58, 66, 93, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [15, 32, 43, 47, 49, 56, 77, 89, 93, 96, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3961', '1.800', '0.1405', '1.800', '0.0942', '7.000', '0.7073', 1, 1, 1, 1, 1723793748.5554762]
VI_after__Init : ['1.202', '0.3967', '1.800', '0.1402', '1.800', '0.0884', '7.000', '0.7074', 1, 1, 1, 1, 1723793756.5458627]
VI_at__the_End : ['1.202', '0.4812', '1.800', '0.1348', '1.800', '0.1163', '7.000', '0.7082', 1, 1, 1, 1, 1723793814.344539]