TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_16_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-006-11 | FUSED_ID : 6359364768380248171
  IC_TEMP :  -82.63 | VDDM : 1120.62 | AUX_INT :  -11.67 | CsaBias :   42.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95514e-03 / 2
  ADC_P0  : -1.16657e-02 ± 2.99315e-02
  ADC_P1  : 8.99267e-03 ± 7.58519e-04
  ADC_P2  : -7.51469e-06 ± 3.84223e-06
  CSA_Chi2/NDF : 1.51714e-04 / 2
  CSA_P0  : 6.07035e-02 ± 8.21552e-03
  CSA_P1  : 1.07013e-02 ± 6.18980e-04
  CSA_P2  : -7.08234e-05 ± 9.42633e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 13, 26, 54, 77, 78, 82, 88, 89, 98, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [1, 6, 23, 28, 45, 60, 61, 65, 68, 74, 82, 92, 108, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3465', '1.800', '0.1345', '1.800', '0.1106', '7.000', '0.7082', 1, 1, 1, 1, 1723796188.1378973]
VI_after__Init : ['1.202', '0.3460', '1.800', '0.1353', '1.800', '0.1030', '7.000', '0.7076', 1, 1, 1, 1, 1723796196.1562698]
VI_at__the_End : ['1.202', '0.4496', '1.800', '0.1356', '1.751', '0.1202', '7.000', '0.7081', 1, 1, 1, 1, 1723796252.4289017]