TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_20_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-008-11 | FUSED_ID : 6359364768380248203
  IC_TEMP :  -74.34 | VDDM : 1118.51 | AUX_INT :  -10.51 | CsaBias :   53.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53333e-03 / 2
  ADC_P0  : -1.05108e-02 ± 2.64611e-02
  ADC_P1  : 9.20882e-03 ± 6.91169e-04
  ADC_P2  : -7.81552e-06 ± 3.60011e-06
  CSA_Chi2/NDF : 1.67312e-04 / 2
  CSA_P0  : 5.80644e-02 ± 8.62753e-03
  CSA_P1  : 1.02529e-02 ± 6.50022e-04
  CSA_P2  : -6.30255e-05 ± 9.89907e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 9, 16, 19, 21, 51, 77, 80, 89, 90, 92, 106, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [4, 5, 8, 11, 13, 29, 37, 48, 55, 74, 92, 101, 104, 105, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2766', '1.800', '0.1472', '1.800', '0.0939', '7.000', '0.7085', 1, 1, 1, 1, 1723796400.6465213]
VI_after__Init : ['1.202', '0.2773', '1.800', '0.1474', '1.800', '0.0873', '7.000', '0.7074', 1, 1, 1, 1, 1723796408.001889]
VI_at__the_End : ['1.202', '0.4494', '1.800', '0.1384', '1.779', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1723796463.6086588]