TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_21_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-009-11 | FUSED_ID : 6359364768380248219
  IC_TEMP :  -67.44 | VDDM : 1126.40 | AUX_INT :   -8.24 | CsaBias :   67.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32277e-03 / 2
  ADC_P0  : -8.24270e-03 ± 2.46404e-02
  ADC_P1  : 8.41814e-03 ± 6.06721e-04
  ADC_P2  : -5.69224e-06 ± 2.97804e-06
  CSA_Chi2/NDF : 1.70854e-04 / 2
  CSA_P0  : 5.89435e-02 ± 8.71837e-03
  CSA_P1  : 1.03418e-02 ± 6.56866e-04
  CSA_P2  : -5.94548e-05 ± 1.00033e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [12, 29, 33, 42, 49, 60, 88, 89, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [14, 28, 31, 35, 40, 57, 58, 72, 78, 91, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4275', '1.800', '0.1552', '1.799', '0.1066', '7.000', '0.7076', 1, 1, 1, 1, 1723796506.068361]
VI_after__Init : ['1.202', '0.4286', '1.800', '0.1553', '1.800', '0.1006', '7.000', '0.7076', 1, 1, 1, 1, 1723796514.149774]
VI_at__the_End : ['1.202', '0.4692', '1.800', '0.1369', '1.800', '0.1172', '7.000', '0.7084', 1, 1, 1, 1, 1723796570.908382]