TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_27_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-012-11 | FUSED_ID : 6359364768380248267
  IC_TEMP :  -64.54 | VDDM : 1122.90 | AUX_INT :   -9.35 | CsaBias :   68.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54956e-03 / 2
  ADC_P0  : -9.35262e-03 ± 2.66377e-02
  ADC_P1  : 8.67380e-03 ± 6.62311e-04
  ADC_P2  : -6.60808e-06 ± 3.28637e-06
  CSA_Chi2/NDF : 1.92061e-04 / 2
  CSA_P0  : 5.97597e-02 ± 9.24362e-03
  CSA_P1  : 1.05748e-02 ± 6.96440e-04
  CSA_P2  : -6.19083e-05 ± 1.06060e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [6, 12, 17, 18, 23, 24, 26, 33, 36, 44, 77, 81, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [4, 13, 24, 32, 37, 45, 48, 62, 77, 79, 81, 92, 112, 120, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3589', '1.800', '0.1670', '1.799', '0.0978', '7.000', '0.7075', 1, 1, 1, 1, 1723796825.1542873]
VI_after__Init : ['1.202', '0.3595', '1.800', '0.1672', '1.800', '0.0929', '7.000', '0.7076', 1, 1, 1, 1, 1723796832.4357293]
VI_at__the_End : ['1.202', '0.4738', '1.800', '0.1382', '1.804', '0.1197', '7.000', '0.7081', 1, 1, 1, 1, 1723796889.5067081]