TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_28_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-013-11 | FUSED_ID : 6359364768380248283
  IC_TEMP :  -64.26 | VDDM : 1130.41 | AUX_INT :   -7.47 | CsaBias :   61.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02352e-03 / 2
  ADC_P0  : -7.47461e-03 ± 2.16833e-02
  ADC_P1  : 8.61532e-03 ± 5.56234e-04
  ADC_P2  : -5.62717e-06 ± 2.82954e-06
  CSA_Chi2/NDF : 1.64183e-04 / 2
  CSA_P0  : 5.93491e-02 ± 8.54646e-03
  CSA_P1  : 1.07955e-02 ± 6.43914e-04
  CSA_P2  : -6.65745e-05 ± 9.80605e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [11, 16, 22, 55, 63, 71, 75, 82, 90, 97, 109, 116, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 16, 39, 67, 81, 88, 93, 102, 103, 105, 107, 118, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3855', '1.800', '0.1578', '1.799', '0.1030', '7.000', '0.7074', 1, 1, 1, 1, 1723796930.681668]
VI_after__Init : ['1.202', '0.3860', '1.800', '0.1585', '1.800', '0.0969', '7.000', '0.7073', 1, 1, 1, 1, 1723796938.6521027]
VI_at__the_End : ['1.202', '0.4734', '1.800', '0.1349', '1.804', '0.1196', '7.000', '0.7081', 1, 1, 1, 1, 1723796996.939909]