TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_43_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-021-12 | FUSED_ID : 6359364768380248412
  IC_TEMP :  -56.86 | VDDM : 1126.49 | AUX_INT :   -7.17 | CsaBias :   70.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.05139e-04 / 2
  ADC_P0  : -7.17236e-03 ± 2.03296e-02
  ADC_P1  : 8.66295e-03 ± 5.10466e-04
  ADC_P2  : -6.77746e-06 ± 2.53030e-06
  CSA_Chi2/NDF : 1.44345e-04 / 2
  CSA_P0  : 5.84549e-02 ± 8.01352e-03
  CSA_P1  : 1.00800e-02 ± 6.03761e-04
  CSA_P2  : -5.06288e-05 ± 9.19456e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [5, 9, 15, 29, 36, 44, 56, 58, 61, 69, 74, 77, 83, 86, 91, 97, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [4, 5, 18, 29, 45, 55, 63, 72, 75, 78, 85, 101, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4216', '1.800', '0.1829', '1.800', '0.1002', '7.000', '0.7072', 1, 1, 1, 1, 1723797781.5966763]
VI_after__Init : ['1.202', '0.4220', '1.800', '0.1830', '1.800', '0.0947', '7.000', '0.7072', 1, 1, 1, 1, 1723797789.5360358]
VI_at__the_End : ['1.201', '0.4890', '1.800', '0.1369', '1.803', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1723797845.0360482]