TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_46_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-023-12 | FUSED_ID : 6359364768380248444
  IC_TEMP :  -56.03 | VDDM : 1141.86 | AUX_INT :   -6.61 | CsaBias :   71.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04690e-03 / 2
  ADC_P0  : -6.60686e-03 ± 2.19483e-02
  ADC_P1  : 8.74006e-03 ± 5.76669e-04
  ADC_P2  : -5.65261e-06 ± 2.99334e-06
  CSA_Chi2/NDF : 1.75187e-04 / 2
  CSA_P0  : 5.85682e-02 ± 8.82823e-03
  CSA_P1  : 1.01759e-02 ± 6.65144e-04
  CSA_P2  : -5.05100e-05 ± 1.01294e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 6, 8, 10, 34, 65, 66, 68, 90, 93, 94, 113, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [0, 5, 6, 10, 15, 31, 36, 56, 57, 63, 79, 117, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2068', '1.800', '0.1565', '1.799', '0.0846', '7.000', '0.7073', 1, 1, 1, 1, 1723797993.7366023]
VI_after__Init : ['1.201', '0.2069', '1.800', '0.1565', '1.800', '0.0794', '7.000', '0.7072', 1, 1, 1, 1, 1723798001.727014]
VI_at__the_End : ['1.201', '0.4949', '1.800', '0.1385', '1.804', '0.1134', '7.000', '0.7081', 1, 1, 1, 1, 1723798058.5257466]