TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_48_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-006-024-12 | FUSED_ID : 6359364768380248460
  IC_TEMP :  -55.34 | VDDM : 1127.98 | AUX_INT :   -6.95 | CsaBias :   76.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.36073e-04 / 2
  ADC_P0  : -6.95049e-03 ± 1.83249e-02
  ADC_P1  : 8.39524e-03 ± 4.52012e-04
  ADC_P2  : -5.82195e-06 ± 2.20985e-06
  CSA_Chi2/NDF : 1.71507e-04 / 2
  CSA_P0  : 5.76245e-02 ± 8.73501e-03
  CSA_P1  : 1.05638e-02 ± 6.58120e-04
  CSA_P2  : -5.50867e-05 ± 1.00224e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 6, 11, 13, 21, 29, 35, 36, 49, 58, 66, 68, 75, 86, 90, 95, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [1, 5, 8, 11, 14, 24, 59, 66, 74, 80, 83, 88, 112, 122, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3243', '1.800', '0.1215', '1.800', '0.0910', '7.000', '0.7082', 1, 1, 1, 1, 1723798099.5625973]
VI_after__Init : ['1.202', '0.3243', '1.800', '0.1214', '1.800', '0.0838', '7.000', '0.7074', 1, 1, 1, 1, 1723798107.5809996]
VI_at__the_End : ['1.202', '0.4985', '1.799', '0.1390', '1.801', '0.1123', '7.000', '0.7083', 1, 1, 1, 1, 1723798164.579745]