TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_25_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-007-008-06 | FUSED_ID : 6359364768380252294
  IC_TEMP :  -71.08 | VDDM : 1113.03 | AUX_INT :   -9.57 | CsaBias :   51.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45175e-03 / 2
  ADC_P0  : -9.57420e-03 ± 2.58038e-02
  ADC_P1  : 8.80575e-03 ± 6.56828e-04
  ADC_P2  : -6.68081e-06 ± 3.32486e-06
  CSA_Chi2/NDF : 1.80379e-04 / 2
  CSA_P0  : 5.94588e-02 ± 8.95810e-03
  CSA_P1  : 1.03229e-02 ± 6.74928e-04
  CSA_P2  : -6.20992e-05 ± 1.02784e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [2, 17, 20, 31, 47, 52, 72, 77, 78, 82, 87, 111, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [3, 26, 57, 59, 65, 75, 76, 79, 86, 87, 113, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2916', '1.800', '0.1517', '1.799', '0.0975', '7.000', '0.7071', 1, 1, 1, 1, 1723800332.2422528]
VI_after__Init : ['1.202', '0.2918', '1.800', '0.1520', '1.801', '0.0915', '7.000', '0.7071', 1, 1, 1, 1, 1723800340.340671]
VI_at__the_End : ['1.202', '0.4588', '1.800', '0.1363', '1.803', '0.1204', '7.000', '0.7077', 1, 1, 1, 1, 1723800395.6665184]