TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_22_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-007-010-06 | FUSED_ID : 6359364768380252326
  IC_TEMP :  -69.41 | VDDM : 1123.12 | AUX_INT :   -9.34 | CsaBias :   59.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55957e-03 / 2
  ADC_P0  : -9.34282e-03 ± 2.67973e-02
  ADC_P1  : 8.62625e-03 ± 6.77663e-04
  ADC_P2  : -5.95649e-06 ± 3.40848e-06
  CSA_Chi2/NDF : 1.91767e-04 / 2
  CSA_P0  : 5.94915e-02 ± 9.23655e-03
  CSA_P1  : 1.04747e-02 ± 6.95907e-04
  CSA_P2  : -6.39801e-05 ± 1.05978e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 7, 25, 40, 46, 61, 72, 85, 88, 103, 108, 109, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [10, 20, 26, 27, 33, 55, 56, 91, 95, 96, 109, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1635', '1.800', '0.1537', '1.800', '0.0922', '7.000', '0.7072', 1, 1, 1, 1, 1723800119.8471634]
VI_after__Init : ['1.202', '0.1635', '1.800', '0.1537', '1.801', '0.0870', '7.000', '0.7072', 1, 1, 1, 1, 1723800127.9425654]
VI_at__the_End : ['1.202', '0.4630', '1.800', '0.1348', '1.800', '0.1191', '7.000', '0.7078', 1, 1, 1, 1, 1723800184.735303]