TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_18_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-007-012-06 | FUSED_ID : 6359364768380252358
  IC_TEMP :  -66.11 | VDDM : 1126.87 | AUX_INT :  -10.55 | CsaBias :   58.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74685e-03 / 2
  ADC_P0  : -1.05523e-02 ± 2.83170e-02
  ADC_P1  : 8.72862e-03 ± 7.08199e-04
  ADC_P2  : -6.74190e-06 ± 3.52776e-06
  CSA_Chi2/NDF : 1.78074e-04 / 2
  CSA_P0  : 6.08415e-02 ± 8.90068e-03
  CSA_P1  : 1.02926e-02 ± 6.70602e-04
  CSA_P2  : -5.86953e-05 ± 1.02125e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [1, 30, 35, 36, 50, 59, 82, 87, 92, 116, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [7, 8, 11, 14, 19, 33, 39, 40, 53, 58, 63, 75, 85, 88, 89, 100, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3746', '1.800', '0.1310', '1.799', '0.0948', '7.000', '0.7069', 1, 1, 1, 1, 1723799906.6021392]
VI_after__Init : ['1.202', '0.3749', '1.800', '0.1310', '1.800', '0.0894', '7.000', '0.7073', 1, 1, 1, 1, 1723799914.6255116]
VI_at__the_End : ['1.201', '0.4724', '1.800', '0.1384', '1.800', '0.1172', '7.000', '0.7081', 1, 1, 1, 1, 1723799971.4822588]