TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_58_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-007-023-01 | FUSED_ID : 6359364768380252529
  IC_TEMP :  -53.23 | VDDM : 1130.97 | AUX_INT :   -7.42 | CsaBias :   68.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71313e-04 / 2
  ADC_P0  : -7.41840e-03 ± 2.11155e-02
  ADC_P1  : 8.46807e-03 ± 5.30252e-04
  ADC_P2  : -5.55641e-06 ± 2.64171e-06
  CSA_Chi2/NDF : 1.58670e-04 / 2
  CSA_P0  : 5.95527e-02 ± 8.40175e-03
  CSA_P1  : 1.02792e-02 ± 6.33011e-04
  CSA_P2  : -5.20260e-05 ± 9.64001e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 7, 8, 12, 29, 51, 52, 58, 63, 73, 78, 109, 117, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [13, 18, 19, 22, 36, 63, 78, 99, 117, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2750', '1.800', '0.1685', '1.799', '0.0865', '7.000', '0.7079', 1, 1, 1, 1, 1723798736.0943491]
VI_after__Init : ['1.202', '0.2753', '1.800', '0.1686', '1.800', '0.0789', '7.000', '0.7071', 1, 1, 1, 1, 1723798744.1827123]
VI_at__the_End : ['1.202', '0.4967', '1.800', '0.1389', '1.800', '0.1120', '7.000', '0.7080', 1, 1, 1, 1, 1723798800.2215343]