TEST_NAME : Wafer
TEST_DATE : 24_08_16-10_55_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-007-025-01 | FUSED_ID : 6359364768380252561
  IC_TEMP :  -47.61 | VDDM : 1131.51 | AUX_INT :   -8.67 | CsaBias :   79.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33921e-03 / 2
  ADC_P0  : -8.67248e-03 ± 2.48483e-02
  ADC_P1  : 8.07211e-03 ± 5.98939e-04
  ADC_P2  : -4.61990e-06 ± 2.87700e-06
  CSA_Chi2/NDF : 1.03392e-04 / 2
  CSA_P0  : 5.42800e-02 ± 6.78212e-03
  CSA_P1  : 9.41239e-03 ± 5.10984e-04
  CSA_P2  : -4.00595e-05 ± 7.78168e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 43, 47, 84, 94, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 17, 26, 32, 41, 44, 56, 60, 75, 84, 92, 111, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2240', '1.800', '0.1406', '1.800', '0.0905', '7.000', '0.7073', 1, 1, 1, 1, 1723798523.9034305]
VI_after__Init : ['1.202', '0.2240', '1.800', '0.1405', '1.799', '0.0848', '7.000', '0.7070', 1, 1, 1, 1, 1723798531.9098706]
VI_at__the_End : ['1.202', '0.4829', '1.800', '0.1341', '1.800', '0.1093', '7.000', '0.7080', 1, 1, 1, 1, 1723798587.162688]