TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_36_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-002-02 | FUSED_ID : 6359364768380256290
  IC_TEMP :  -80.19 | VDDM : 1107.64 | AUX_INT :  -23.99 | CsaBias :   39.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.42752e-03 / 2
  ADC_P0  : -2.39858e-02 ± 4.05475e-02
  ADC_P1  : 9.11216e-03 ± 1.02393e-03
  ADC_P2  : -7.35072e-06 ± 5.21288e-06
  CSA_Chi2/NDF : 1.99246e-04 / 2
  CSA_P0  : 5.63885e-02 ± 9.41493e-03
  CSA_P1  : 1.02881e-02 ± 7.09347e-04
  CSA_P2  : -6.67345e-05 ± 1.08025e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 4, 8, 38, 57, 58, 79, 82, 87, 99, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [10, 13, 19, 21, 28, 36, 37, 42, 46, 94, 96, 105, 114, 120, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2404', '1.800', '0.1237', '1.800', '0.0322', '7.000', '0.7052', 1, 1, 1, 1, 1723800965.0969791]
VI_after__Init : ['1.202', '0.2403', '1.800', '0.1237', '1.801', '0.0833', '7.000', '0.7072', 1, 1, 1, 1, 1723800972.38922]
VI_at__the_End : ['1.202', '0.4350', '1.799', '0.1365', '1.803', '0.1192', '7.000', '0.7078', 1, 1, 1, 1, 1723801026.8070636]