TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_39_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-004-02 | FUSED_ID : 6359364768380256322
  IC_TEMP :  -85.94 | VDDM : 1126.85 | AUX_INT :  -11.34 | CsaBias :   59.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.20758e-03 / 2
  ADC_P0  : -1.13358e-02 ± 3.19745e-02
  ADC_P1  : 8.90744e-03 ± 8.40892e-04
  ADC_P2  : -5.55413e-06 ± 4.44209e-06
  CSA_Chi2/NDF : 1.42908e-04 / 2
  CSA_P0  : 5.95439e-02 ± 7.97352e-03
  CSA_P1  : 1.08174e-02 ± 6.00747e-04
  CSA_P2  : -7.76900e-05 ± 9.14867e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [9, 10, 17, 33, 62, 79, 80, 103, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [26, 29, 43, 52, 54, 55, 62, 75, 85, 92, 97, 100, 106, 114, 117, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2016', '1.800', '0.1590', '1.799', '0.0915', '7.000', '0.7073', 1, 1, 1, 1, 1723801178.209021]
VI_after__Init : ['1.202', '0.2017', '1.800', '0.1593', '1.801', '0.0859', '7.000', '0.7073', 1, 1, 1, 1, 1723801186.1842704]
VI_at__the_End : ['1.202', '0.4290', '1.799', '0.1374', '1.768', '0.1202', '7.000', '0.7078', 1, 1, 1, 1, 1723801241.3592565]