TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_43_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-006-02 | FUSED_ID : 6359364768380256354
  IC_TEMP :  -71.96 | VDDM : 1121.94 | AUX_INT :  -10.25 | CsaBias :   60.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55560e-03 / 2
  ADC_P0  : -1.02537e-02 ± 2.66986e-02
  ADC_P1  : 8.84037e-03 ± 6.78005e-04
  ADC_P2  : -6.79124e-06 ± 3.43503e-06
  CSA_Chi2/NDF : 1.81449e-04 / 2
  CSA_P0  : 5.85664e-02 ± 8.98463e-03
  CSA_P1  : 1.02838e-02 ± 6.76927e-04
  CSA_P2  : -6.14006e-05 ± 1.03088e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [7, 11, 23, 25, 54, 73, 77, 83, 96, 110, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 12, 13, 20, 33, 41, 46, 50, 58, 61, 85, 96, 97, 101, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2780', '1.800', '0.1314', '1.799', '0.0919', '7.000', '0.7072', 1, 1, 1, 1, 1723801391.5480466]
VI_after__Init : ['1.202', '0.2781', '1.800', '0.1314', '1.800', '0.0864', '7.000', '0.7073', 1, 1, 1, 1, 1723801399.5293348]
VI_at__the_End : ['1.202', '0.4579', '1.800', '0.1380', '1.803', '0.1208', '7.000', '0.7077', 1, 1, 1, 1, 1723801454.8155272]