TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_44_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-007-02 | FUSED_ID : 6359364768380256370
  IC_TEMP :  -83.93 | VDDM : 1116.28 | AUX_INT :  -11.87 | CsaBias :   51.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.03962e-03 / 2
  ADC_P0  : -1.18682e-02 ± 3.05924e-02
  ADC_P1  : 9.14274e-03 ± 7.94799e-04
  ADC_P2  : -7.38516e-06 ± 4.13702e-06
  CSA_Chi2/NDF : 1.68089e-04 / 2
  CSA_P0  : 5.95720e-02 ± 8.64754e-03
  CSA_P1  : 1.09277e-02 ± 6.51530e-04
  CSA_P2  : -7.46153e-05 ± 9.92203e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [8, 12, 23, 26, 72, 75, 76, 80, 89, 94, 99, 104, 116, 117, 123, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 11, 14, 22, 52, 60, 67, 75, 81, 95, 98, 102, 106, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1493', '1.800', '0.1365', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1723801497.7878406]
VI_after__Init : ['1.202', '0.1495', '1.800', '0.1364', '1.800', '0.0800', '7.000', '0.7069', 1, 1, 1, 1, 1723801505.7711668]
VI_at__the_End : ['1.193', '0.4448', '1.800', '0.1381', '1.811', '0.1211', '7.000', '0.7079', 1, 1, 1, 1, 1723801560.5105195]