TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_46_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-008-02 | FUSED_ID : 6359364768380256386
  IC_TEMP :  -69.08 | VDDM : 1116.80 | AUX_INT :   -9.80 | CsaBias :   70.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38030e-03 / 2
  ADC_P0  : -9.79862e-03 ± 2.51095e-02
  ADC_P1  : 8.99060e-03 ± 6.43334e-04
  ADC_P2  : -7.44253e-06 ± 3.27736e-06
  CSA_Chi2/NDF : 2.12187e-04 / 2
  CSA_P0  : 5.67714e-02 ± 9.71587e-03
  CSA_P1  : 1.01995e-02 ± 7.32021e-04
  CSA_P2  : -5.86618e-05 ± 1.11478e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  20
 | N_BROKEN_FAST :  [4, 7, 10, 12, 18, 37, 46, 50, 69, 76, 79, 82, 83, 85, 90, 96, 100, 105, 108, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [15, 28, 36, 38, 44, 64, 68, 69, 83, 99, 108, 113, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1854', '1.800', '0.1246', '1.800', '0.0899', '7.000', '0.7072', 1, 1, 1, 1, 1723801604.227787]
VI_after__Init : ['1.202', '0.1854', '1.800', '0.1247', '1.800', '0.0837', '7.000', '0.7072', 1, 1, 1, 1, 1723801612.178179]
VI_at__the_End : ['1.202', '0.4630', '1.800', '0.1365', '1.803', '0.1185', '6.997', '0.7085', 1, 1, 1, 1, 1723801666.7395701]