TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_48_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-009-02 | FUSED_ID : 6359364768380256402
  IC_TEMP :  -68.51 | VDDM : 1125.66 | AUX_INT :   -9.31 | CsaBias :   60.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27935e-03 / 2
  ADC_P0  : -9.30624e-03 ± 2.41853e-02
  ADC_P1  : 8.77204e-03 ± 6.10000e-04
  ADC_P2  : -6.83767e-06 ± 3.05808e-06
  CSA_Chi2/NDF : 1.86341e-04 / 2
  CSA_P0  : 5.92087e-02 ± 9.10492e-03
  CSA_P1  : 1.00227e-02 ± 6.85990e-04
  CSA_P2  : -5.76790e-05 ± 1.04468e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [12, 43, 47, 49, 51, 53, 58, 84, 86, 88, 90, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [9, 15, 35, 49, 52, 60, 63, 83, 86, 99, 100, 109, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3435', '1.800', '0.1410', '1.799', '0.0968', '7.000', '0.7072', 1, 1, 1, 1, 1723801710.6838586]
VI_after__Init : ['1.202', '0.3436', '1.800', '0.1412', '1.800', '0.0908', '7.000', '0.7075', 1, 1, 1, 1, 1723801718.680209]
VI_at__the_End : ['1.202', '0.4578', '1.801', '0.1363', '1.800', '0.1193', '7.000', '0.7079', 1, 1, 1, 1, 1723801773.8016632]