TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_52_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-011-02 | FUSED_ID : 6359364768380256434
  IC_TEMP :  -55.92 | VDDM : 1122.00 | AUX_INT :   -9.09 | CsaBias :   67.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35491e-03 / 2
  ADC_P0  : -9.09377e-03 ± 2.49388e-02
  ADC_P1  : 8.59477e-03 ± 6.24968e-04
  ADC_P2  : -6.12396e-06 ± 3.11345e-06
  CSA_Chi2/NDF : 1.60712e-04 / 2
  CSA_P0  : 5.88711e-02 ± 8.45565e-03
  CSA_P1  : 9.89986e-03 ± 6.37072e-04
  CSA_P2  : -5.13217e-05 ± 9.70185e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [8, 20, 30, 52, 53, 56, 60, 72, 94, 101, 105, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [2, 9, 12, 19, 46, 48, 51, 63, 69, 70, 76, 77, 83, 85, 88, 98, 102, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1966', '1.799', '0.1534', '1.799', '0.0880', '7.000', '0.7071', 1, 1, 1, 1, 1723801923.5453486]
VI_after__Init : ['1.202', '0.1967', '1.800', '0.1533', '1.800', '0.0822', '7.000', '0.7073', 1, 1, 1, 1, 1723801931.5336366]
VI_at__the_End : ['1.202', '0.4754', '1.800', '0.1349', '1.806', '0.1153', '7.000', '0.7081', 1, 1, 1, 1, 1723801987.1290576]