TEST_NAME : Wafer
TEST_DATE : 24_08_16-11_57_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-014-02 | FUSED_ID : 6359364768380256482
  IC_TEMP :  -56.95 | VDDM : 1126.68 | AUX_INT :  -11.26 | CsaBias :   65.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.18090e-03 / 2
  ADC_P0  : -1.12569e-02 ± 3.17342e-02
  ADC_P1  : 8.61937e-03 ± 7.93962e-04
  ADC_P2  : -5.97500e-06 ± 3.97171e-06
  CSA_Chi2/NDF : 1.28535e-04 / 2
  CSA_P0  : 6.03631e-02 ± 7.56194e-03
  CSA_P1  : 1.03211e-02 ± 5.69738e-04
  CSA_P2  : -5.68072e-05 ± 8.67644e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 1, 2, 17, 48, 50, 53, 59, 64, 81, 82, 83, 96, 99, 116, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [20, 25, 33, 38, 45, 63, 65, 76, 82, 96, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3359', '1.800', '0.1756', '1.799', '0.0954', '7.000', '0.7079', 1, 1, 1, 1, 1723802242.9342623]
VI_after__Init : ['1.202', '0.3362', '1.800', '0.1757', '1.799', '0.0881', '7.000', '0.7074', 1, 1, 1, 1, 1723802250.9286606]
VI_at__the_End : ['1.202', '0.4811', '1.800', '0.1390', '1.800', '0.1136', '7.000', '0.7079', 1, 1, 1, 1, 1723802306.1152306]