TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_02_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-017-05 | FUSED_ID : 6359364768380256533
  IC_TEMP :  -61.12 | VDDM : 1140.43 | AUX_INT :   -5.17 | CsaBias :   72.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.10271e-04 / 2
  ADC_P0  : -5.17303e-03 ± 1.92782e-02
  ADC_P1  : 8.69473e-03 ± 5.01834e-04
  ADC_P2  : -5.80933e-06 ± 2.57951e-06
  CSA_Chi2/NDF : 1.40126e-04 / 2
  CSA_P0  : 6.30400e-02 ± 7.89554e-03
  CSA_P1  : 1.00656e-02 ± 5.94872e-04
  CSA_P2  : -5.20231e-05 ± 9.05919e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 11, 15, 32, 39, 55, 57, 62, 65, 68, 81, 88, 96, 99, 100, 103, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [11, 21, 29, 46, 49, 51, 53, 56, 60, 67, 80, 84, 97, 98, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4260', '1.800', '0.1315', '1.799', '0.0919', '7.000', '0.7072', 1, 1, 1, 1, 1723802557.6410248]
VI_after__Init : ['1.202', '0.4264', '1.800', '0.1317', '1.800', '0.0866', '7.000', '0.7072', 1, 1, 1, 1, 1723802564.9813879]
VI_at__the_End : ['1.202', '0.4863', '1.800', '0.1416', '1.803', '0.1132', '7.000', '0.7081', 1, 1, 1, 1, 1723802622.8317337]