TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_20_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-008-027-05 | FUSED_ID : 6359364768380256693
  IC_TEMP :  -52.01 | VDDM : 1108.67 | AUX_INT :   -6.16 | CsaBias :   75.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00182e-03 / 2
  ADC_P0  : -6.16167e-03 ± 2.14466e-02
  ADC_P1  : 8.26484e-03 ± 5.28573e-04
  ADC_P2  : -5.25350e-06 ± 2.57758e-06
  CSA_Chi2/NDF : 1.03161e-04 / 2
  CSA_P0  : 5.74462e-02 ± 6.77455e-03
  CSA_P1  : 9.74761e-03 ± 5.10413e-04
  CSA_P2  : -4.37311e-05 ± 7.77299e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [11, 14, 25, 37, 80, 101, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [17, 27, 45, 53, 79, 80, 100, 102, 106, 111, 112, 114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1223', '1.800', '0.1575', '1.799', '0.0844', '7.000', '0.7074', 1, 1, 1, 1, 1723803614.1236513]
VI_after__Init : ['1.202', '0.1224', '1.800', '0.1575', '1.800', '0.0786', '7.000', '0.7072', 1, 1, 1, 1, 1723803622.1160393]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1332', '1.803', '0.1111', '7.000', '0.7080', 1, 1, 1, 1, 1723803678.1049435]