TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_06_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-002-15 | FUSED_ID : 6359364768380260399
  IC_TEMP :  -79.84 | VDDM : 1110.89 | AUX_INT :  -11.57 | CsaBias :   58.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.24839e-03 / 2
  ADC_P0  : -1.15739e-02 ± 3.22100e-02
  ADC_P1  : 8.83821e-03 ± 8.18562e-04
  ADC_P2  : -6.57410e-06 ± 4.16094e-06
  CSA_Chi2/NDF : 1.89522e-04 / 2
  CSA_P0  : 5.80336e-02 ± 9.18232e-03
  CSA_P1  : 1.03493e-02 ± 6.91821e-04
  CSA_P2  : -6.71525e-05 ± 1.05356e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 33, 42, 47, 68, 69, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 3, 5, 12, 16, 35, 42, 62, 75, 79, 94, 103, 117, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3643', '1.800', '0.1324', '1.800', '0.1004', '7.000', '0.7075', 1, 1, 1, 1, 1723806375.1776922]
VI_after__Init : ['1.201', '0.3650', '1.800', '0.1324', '1.800', '0.0942', '7.000', '0.7071', 1, 1, 1, 1, 1723806383.1160805]
VI_at__the_End : ['1.202', '0.4396', '1.800', '0.1356', '1.800', '0.1193', '7.000', '0.7079', 1, 1, 1, 1, 1723806439.6848383]