TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_59_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-006-15 | FUSED_ID : 6359364768380260463
  IC_TEMP :  -70.58 | VDDM : 1117.09 | AUX_INT :  -10.72 | CsaBias :   58.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.07226e-02 ± 2.84115e-02
  ADC_P1  : 8.71622e-03 ± 7.12868e-04
  ADC_P2  : -6.47022e-06 ± 3.57140e-06
  CSA_Chi2/NDF : 1.83450e-04 / 2
  CSA_P0  : 6.06568e-02 ± 9.03403e-03
  CSA_P1  : 1.02898e-02 ± 6.80649e-04
  CSA_P2  : -6.13348e-05 ± 1.03655e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 3, 5, 36, 50, 68, 73, 98, 103, 105, 106, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [2, 28, 32, 42, 43, 44, 47, 49, 51, 67, 83, 88, 90, 102, 120, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3181', '1.800', '0.1496', '1.799', '0.0988', '7.000', '0.7072', 1, 1, 1, 1, 1723805953.9312081]
VI_after__Init : ['1.202', '0.3187', '1.800', '0.1497', '1.800', '0.0932', '7.000', '0.7072', 1, 1, 1, 1, 1723805961.9156141]
VI_at__the_End : ['1.202', '0.4607', '1.800', '0.1380', '1.805', '0.1199', '7.000', '0.7079', 1, 1, 1, 1, 1723806017.4594927]